ARTHUR BROWN (AST, AEROSPACE METALLIC MATERIALS) LOADS A CERAMIC COATED SILICON WAFER INTO A KRATOS (ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS) TO PERFORM X-RAY PHOTOELECTRON SPECTROSCOPY (XPS). XPS IS A TECHNIQUE THAT ANALYZES THE SURFACE CHEMISTRY OF A SAMPLE BY IRRADIATING IT WITH X-RAYS AND MEASURING THE NUMBER AND KINETIC ENERGY OF ELECTRON THAT ESCAPE.