Zygo NewView White Light iInterferometer Front view of Zygo NewView White Light iInterferometer

“Do not remove” and “Take a calibration measurement first!” Photograph of warning labels attached to a Zygo NewView white light interferometer. This interferometer takes optical images of materials, like a regular optical microscope, but also provides quantitative information on the height of the features being imaged. The instrument allows scientists to map the surface topography of a sample at relatively high spatial resolution. It can be used to measure how materials are affected by friction and wear.