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Secondary emission monitor (SEM) for the ISR
1968
CERN
Geneva, Switzerland
A secondary emission monitor (SEM) developed for quantitative beam profile measurements in the ISR and the transfer channels. 15 horizontal and 15 vertical thin foils were connected to individual 100 pf capacitors, and signals, varying from 5 to 500 mA, were sequentially gated into a cable after passing through 'sample and hold' circuits.
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Details
- Title: Secondary emission monitor (SEM) for the ISR
- Creator: CERN PhotoLab
- Date Created: 1968-08, 1968
- Contributor: GenevaCERN1968-8
- Medium: Film, Photographic negative
- Link to Internal Document: http://cds.cern.ch/record/1728924
- Internal Reference: Rubrique: Date Planche:8 68 De:89 A:89
- Comment: Album with images scanned from original photo negatives
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